Please use this identifier to cite or link to this item:
                
    
    http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274| Title: | Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers | 
| Authors: | Pardo, Scott | 
| Keywords: | Test Engineers | 
| Issue Date: | 2014 | 
| Publisher: | CRC Press | 
| URI: | http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274 | 
| ISBN: | 978-1-4665-8689-5 | 
| Appears in Collections: | Electronics and Communication Engineering | 
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers.pdf Restricted Access | 25.53 MB | Adobe PDF | View/Open Request a copy | 
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

