Please use this identifier to cite or link to this item: http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274
Title: Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers
Authors: Pardo, Scott
Keywords: Test Engineers
Issue Date: 2014
Publisher: CRC Press
URI: http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274
ISBN: 978-1-4665-8689-5
Appears in Collections:Electronics and Communication Engineering

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