Please use this identifier to cite or link to this item: http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274
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dc.contributor.authorPardo, Scott-
dc.date.accessioned2022-09-27T05:04:02Z-
dc.date.available2022-09-27T05:04:02Z-
dc.date.issued2014-
dc.identifier.isbn978-1-4665-8689-5-
dc.identifier.urihttp://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274-
dc.language.isoenen_US
dc.publisherCRC Pressen_US
dc.subjectTest Engineersen_US
dc.titleEquivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineersen_US
dc.typeBooken_US
Appears in Collections:Electronics and Communication Engineering

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