Please use this identifier to cite or link to this item:
http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Pardo, Scott | - |
dc.date.accessioned | 2022-09-27T05:04:02Z | - |
dc.date.available | 2022-09-27T05:04:02Z | - |
dc.date.issued | 2014 | - |
dc.identifier.isbn | 978-1-4665-8689-5 | - |
dc.identifier.uri | http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/10274 | - |
dc.language.iso | en | en_US |
dc.publisher | CRC Press | en_US |
dc.subject | Test Engineers | en_US |
dc.title | Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers | en_US |
dc.type | Book | en_US |
Appears in Collections: | Electronics and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers.pdf Restricted Access | 25.53 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.