Please use this identifier to cite or link to this item:
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Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Perelroyzen, Evgeni | - |
dc.date.accessioned | 2023-01-10T08:54:17Z | - |
dc.date.available | 2023-01-10T08:54:17Z | - |
dc.date.issued | 2007 | - |
dc.identifier.isbn | 978-0-8493-3057-5 | - |
dc.identifier.uri | http://rguir.inflibnet.ac.in:8080/jspui/handle/123456789/15671 | - |
dc.language.iso | en | en_US |
dc.publisher | Taylor & Francis Group | en_US |
dc.subject | Digital integrated circuits--Testing | en_US |
dc.subject | Digital integrated circuits--Design and construction | en_US |
dc.title | Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow | en_US |
dc.type | Book | en_US |
Appears in Collections: | Electronics and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Digital Integrated Circuits.pdf Restricted Access | 50.09 MB | Adobe PDF | View/Open Request a copy |
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